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A study of a storage reliability estimation problem
Author(s) -
Zhao M.,
Xie M.,
Zhang Y. T.
Publication year - 1995
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680110208
Subject(s) - weibull distribution , reliability (semiconductor) , reliability engineering , estimation , parametric statistics , computer science , computer data storage , simple (philosophy) , engineering , statistics , mathematics , power (physics) , physics , philosophy , systems engineering , epistemology , quantum mechanics , operating system
Abstract Storage reliability, which describes the failure or deterioration of items in a dormant state, is considered in this paper. The study presented here is focused on the estimation of the storage reliability after a certain amount of storage time. We start with simple non‐parametric estimation of the current reliability and then study the problem of parametric estimation based on a simple Weibull distribution assumption. Both maximum likelihood estimation and graphical techniques are considered in this case. The study is useful for planning a storage environment and making a decision about the maximum length of storage. Furthermore, the information can be used in the design and improvement of products for which the storage is an important part of the product's life cycle. A numerical example is provided to enlighten the idea.