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Reliability Related Research on Plastic IC Packages: A Test Chip Approach, Richard van Gestel, Delft University Press, 1994. Number of pages: 318
Author(s) -
O'Connor P. D. T.
Publication year - 1995
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680110116
Subject(s) - reliability (semiconductor) , citation , test (biology) , computer science , library science , physics , power (physics) , paleontology , quantum mechanics , biology
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