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Reliability and Risk Assessment, J.D. Andrews and T.R. Moss, Longman Scientific and Technical, 1993 (John Wiley in U.S.A.), Number of pages: 368
Author(s) -
O'Connor P. D. T.
Publication year - 1995
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680110114
Subject(s) - citation , reliability (semiconductor) , quality (philosophy) , library science , computer science , operations research , mathematics , philosophy , physics , epistemology , thermodynamics , power (physics)