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Study of the influence of thermal effects on the electromigration tests
Author(s) -
Abdeslam Saǎd,
Lormand Gérard
Publication year - 1995
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680110105
Subject(s) - electromigration , divergence (linguistics) , current (fluid) , thermodynamics , thermal , materials science , flux (metallurgy) , simple (philosophy) , physics , metallurgy , philosophy , linguistics , epistemology , composite material
A simple one‐dimensional thermal model of the electromigration phenomenon shows that the usual measurement methods of the temperature during lifetime tests usually lead to an erroneous determination of Black's relation parameters n and Q . The effects of the current density and the temperature estimation method on the errors on n and Q are analysed. An estimation of the temperature of the site where the flux divergence is maximum allows us to understand the behaviour of n and Q . The difference between real and apparent activation energy, at low current densities, is also calculated.