Premium
Analysis of HBM ESD testers and specifications using a fourth‐order lumped element model
Author(s) -
Verhaege Koen,
Roussel Philippe J.,
Groeseneken Guido,
Maes Herman E.,
Gieser Horst,
Russ Christian,
Egger Peter,
Guggenmos Xaver,
Kuper Fred G.
Publication year - 1994
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680100413
Subject(s) - human body model , electrostatic discharge , capacitance , parasitic capacitance , engineering , electronic engineering , reliability engineering , electrical engineering , physics , voltage , electrode , quantum mechanics
This paper presents the general and analytical solution of a fourth‐order lumped element model (LEM) to describe human body model (HBM) electrostatic discharge (ESD) testers including the main tester parasitic elements. The analytical fitting to the LEM of experimentally obtained HBM pulse data is a new scientifically justified tool to determine HBM tester parasitic elements. The impact of the test board capacitance on HBM testing is demonstrated and explained. Furthermore, the MIL 883C/3015.7 1 and EOS/ESD S5.1‐1991 2 Standards on HBM testers are evaluated upon their selectivity to the test board capacitance. Finally, recommendations to improve HBM tester specifications regarding their selectivity to the parasitic test board capacitance are formulated