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Autoclave tests of 64 K and 256 K SRAMs
Author(s) -
Polman H. L. A.,
Fokkens K.
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090506
Subject(s) - autoclave , materials science , cluster (spacecraft) , manufacturing process , humidity , nuclear engineering , reliability engineering , engineering , computer science , composite material , metallurgy , thermodynamics , operating system , physics
Results are presented of HAST tests of 64 K and 256 K SRAMs of 10 manufacturers at three temperature/humidity conditions. Failed memory cells are clustered in four different, manufacturer dependent, ways. A relation between the type of defect cluster and weaknesses in the manufacturing process is presented.