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Correlation between EMI‐induced failures and large‐signal response of fet‐input opamps
Author(s) -
Golzio D.,
Graffi S.,
V.Kovács Zs. M.,
Masetti G.
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090503
Subject(s) - slew rate , operational amplifier , emi , electronic engineering , common mode signal , engineering , electrical engineering , electromagnetic interference , amplifier , digital signal processing , cmos , analog signal , voltage
Correlation between EMI susceptibility of opamp circuits and asymmetry in the slew‐rates of the basic opamp is discussed with reference to FET‐input devices. For the LF355 opamp the role played by an internal feedback loop on the common‐mode, slew‐rate and susceptibility performances is analysed. Other FET‐input opamps, such as the OP42, which exhibit an almost symmetric slew‐rate, have a very small EMI susceptibility.