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Estimating device reliability: Assessment of credibility, Franklin R. Nash, Kluwer Academic Publishers, 1993. Number of pages: 213
Author(s) -
O'Connor P. D. T.
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090433
Subject(s) - credibility , citation , reliability (semiconductor) , computer science , quality (philosophy) , library science , operations research , mathematics , political science , philosophy , physics , law , thermodynamics , power (physics) , epistemology