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Digital hardware testing: Transistor‐level fault modeling and testing, Rochit Rajsuman, Artech House, Inc, 1992, Price $78.00, Number of pages; 311
Author(s) -
Richardson A. M. D.
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090432
Subject(s) - citation , reliability (semiconductor) , quality (philosophy) , computer science , library science , physics , power (physics) , quantum mechanics
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