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Simulation, a tool for designing‐in reliability
Author(s) -
Brombacher Aarnout,
Van Geest Erik,
Arendsen Robert,
Van Steenwijk Anne,
Herrmann Otto
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090403
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , stressor , electronic circuit , process (computing) , engineering , psychology , electrical engineering , programming language , neuroscience , power (physics) , physics , quantum mechanics
This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor‐sets). The paper describes the backgrounds of stressor‐susceptibility analysis, the need for this analysis and the way this method is used for high‐level design and optimization of electronic circuits.