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Spc of a near zero‐defect process subject to random shocks
Author(s) -
Xie M.,
Goh T. N.
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090205
Subject(s) - statistical process control , process (computing) , zero (linguistics) , series (stratigraphy) , identification (biology) , computer science , subject (documents) , type (biology) , statistics , mathematics , algorithm , paleontology , philosophy , linguistics , botany , library science , biology , operating system , ecology
In this paper we study the problem of monitoring and control of a type of process in which long series with no non‐conformities are observed together with occasional samples containing a large number of non‐conformities. We call this a near zero‐defect process subject to random shocks. Such processes occur often in practice, and a model is proposed for the identification of real non‐random variations of process characteristics. Based on the statistical analysis carried out for this model, a procedure for decision‐making in the control of this type of process is suggested, and analysis of some actual cases presented.