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VLSI reliability, Anant G. Sabnis. Vol. 22 of the series VLSI Electronics Microstructure Science, Academic Press 1990. Number of pages: 207. Price: $85.00
Author(s) -
Jensen Finn
Publication year - 1993
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680090121
Subject(s) - citation , very large scale integration , reliability (semiconductor) , computer science , quality (philosophy) , series (stratigraphy) , library science , philosophy , physics , embedded system , epistemology , paleontology , power (physics) , quantum mechanics , biology
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