On the measurement of field return rates | Zendy

Shen Michael S. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

On the measurement of field return rates

Author(s) -

Shen Michael S.

Publication year - 1992

Publication title -

quality and reliability engineering international

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.913

H-Index - 62

eISSN - 1099-1638

pISSN - 0748-8017

DOI - 10.1002/qre.4680080513

Subject(s) - reliability (semiconductor) , reliability engineering , quality (philosophy) , field (mathematics) , rate of return , statistics , term (time) , failure rate , product (mathematics) , set (abstract data type) , econometrics , function (biology) , computer science , mathematics , engineering , economics , physics , power (physics) , geometry , finance , quantum mechanics , pure mathematics , programming language , evolutionary biology , biology

A set of well‐defined equations is required for quantifying statistical product quality and reliability. Specific equations and their inherent measurement errors as a function of reporting period, lead time and fluctuating shipment levels are discussed. This paper covers three quality and reliability measurements, two being new‐shipment measurements: (1) overall embedded annualized field return rate, (2) short‐term or four‐quarter rolling annualized field return rate, and one being repair quality: Rate of re‐return.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research