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On the measurement of field return rates
Author(s) -
Shen Michael S.
Publication year - 1992
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680080513
Subject(s) - reliability (semiconductor) , reliability engineering , quality (philosophy) , field (mathematics) , rate of return , statistics , term (time) , failure rate , product (mathematics) , set (abstract data type) , econometrics , function (biology) , computer science , mathematics , engineering , economics , physics , power (physics) , geometry , finance , quantum mechanics , pure mathematics , programming language , evolutionary biology , biology
A set of well‐defined equations is required for quantifying statistical product quality and reliability. Specific equations and their inherent measurement errors as a function of reporting period, lead time and fluctuating shipment levels are discussed. This paper covers three quality and reliability measurements, two being new‐shipment measurements: (1) overall embedded annualized field return rate, (2) short‐term or four‐quarter rolling annualized field return rate, and one being repair quality: Rate of re‐return.