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Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing
Author(s) -
Bouvet C.,
Fouillat P.,
Dom J. P.,
Danto Y.
Publication year - 1992
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680080308
Subject(s) - reliability engineering , laser beams , laser , engineering , materials science , electronic engineering , mechanical engineering , computer science , optics , physics
Functional tests with an electrical tester have revealed defects in an ASIC. Results analysis leads to incriminating different areas of the layout. A laser beam tester localizes the logic operator responsible for the dysfunction observed with the electrical tester.