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Testing Semiconductor Memories: Theory and Practice, A.J. van de Goor, Wiley, 1991. Number of pages: 512. Price: £34.95
Author(s) -
O'connor P. D. T.
Publication year - 1992
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680080216
Subject(s) - citation , reliability (semiconductor) , computer science , quality (philosophy) , library science , philosophy , physics , epistemology , quantum mechanics , power (physics)