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Statistical analysis of an age model for imperfectly repaired systems
Author(s) -
Guo R.,
Love C. E.
Publication year - 1992
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680080209
Subject(s) - imperfect , poisson distribution , reliability (semiconductor) , reliability engineering , homogeneous , poisson regression , computer science , failure rate , econometrics , mathematical optimization , mathematics , engineering , statistics , population , physics , philosophy , linguistics , power (physics) , demography , quantum mechanics , combinatorics , sociology
An age model is proposed for modelling imperfect repairable systems operating under a non‐homogeneous Poisson framework. The imperfect repair model investigated here effectively includes good‐as‐new, imperfect repair and bad‐as‐old regimes that have appeared separately in reliability engineering literature. To incorporate the impact of the equipment's operating environment, proportional intensities assumptions are integrated into the age model. Maximum likeihood estimates are derived for the parameters of interest.