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A two‐stage sampling plan for bogey tests
Author(s) -
Wang C. Julius,
Lu MingWei
Publication year - 1992
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680080106
Subject(s) - weibull distribution , reliability engineering , test plan , reliability (semiconductor) , fixture , test (biology) , engineering , sampling (signal processing) , plan (archaeology) , automotive industry , power (physics) , computer science , statistics , mathematics , mechanical engineering , history , paleontology , physics , electrical engineering , archaeology , filter (signal processing) , quantum mechanics , biology , aerospace engineering
When accelerated life tests can be applied to simulate the normal product operating conditions, engineers usually terminate the test upon successfully running to a multiple of a prespecified bogey without any failure to demonstrate a required minimum reliability level. This testing philosophy is called ‘bogey test’ (or extended test) in the automotive industry and is a subset of type I censored tests in standard reliability literature. Sometimes engineers encounter the difficulty of using this reliability demonstration approach when incidents do occur during the test. The incident might be a legitimate failure or a withdrawal caused by external forces such as a broken fixture of a non‐functional power supply. This paper derives a two‐stage sampling plan for possible back‐up solution on planning and running a bogey test with possible occurrence of incidents. A Weibull distribution with a given shape parameter is assumed for the underlying life characteristic.