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Reliability improvement of electronic circuits based on physical failure mechanisms in components
Author(s) -
Brombacher A. C.,
de Boer H. A.,
Bennion M.,
Fennema P. H.,
Herrmann O. E.
Publication year - 1991
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680070412
Subject(s) - reliability engineering , reliability (semiconductor) , process (computing) , computer science , circuit reliability , electronic circuit , engineering , electrical engineering , power (physics) , physics , quantum mechanics , operating system
Traditionally the position of reliability analysis in the design and production process of electronic circuits is a position of reliability verification. A completed design is checked on reliability aspects and either rejected or accepted for production. This paper describes a method to model physical failure mechanisms within components in such a way that they can be used for reliability optimization, not after, but during the early phase of the design process. Furthermore a prototype of a CAD software tool is described, which can highlight components likely to fail and automatically adjust circuit parameters to improve product reliability.