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Optoelectronics reliability
Author(s) -
Ikegami Tetsuhiko,
Fukuda Mitsuo
Publication year - 1991
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680070407
Subject(s) - optoelectronics , laser , photodetector , reliability (semiconductor) , materials science , degradation (telecommunications) , gallium arsenide , optics , computer science , telecommunications , physics , power (physics) , quantum mechanics
This paper reviews degradation modes and reliability in several kinds of InGaAsP/InP lasers and photodetectors used in optical fibre transmission systems. From the viewpoint of degradation mechanisms, BH type Fabry–Perot lasers, DFB lasers, a 0.98 μm strained quantum well InGaAs/GaAs laser, and InGaAs PIN photodetectors and APDs are reviewed.
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