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New methods for specification and determination of component reliability characteristics
Author(s) -
Møltoft Jørgen
Publication year - 1991
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680070205
Subject(s) - component (thermodynamics) , reliability engineering , reliability (semiconductor) , field (mathematics) , point (geometry) , computer science , exponential distribution , physics of failure , reliability theory , electronic component , failure rate , systems engineering , engineering , mathematics , statistics , electrical engineering , power (physics) , physics , geometry , quantum mechanics , pure mathematics , thermodynamics
In the last two decades it has become clear that component lifetime distributions are seldom exponential. Early failures due to flaws have been of major concern. Various models to cater for this observation have been suggested. The models have been developed from a component rather from a system point of view. Furthermore, no substitute for the heavily criticized MIL‐HDBK‐217‐type prediction handbooks has been offered. This paper describes a recently developed methodology to arrive at realistic component reliability characteristics, which take into account the non‐exponential component lifetime distributions. These characteristics are developed from a system's point of view, which makes it easier for the system manufacturer to assess the reliability of their systems in the field. The methodology is based on six years of research in field performance of electronic systems. The research has been carried out in close co‐operation with industrial companies.