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The reliability physics approach to failure prediction modelling
Author(s) -
Pecht Michael,
Dasgupta Abhijit,
Barker Donald,
Leonard Charles T.
Publication year - 1990
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680060409
Subject(s) - physics of failure , reliability (semiconductor) , reliability engineering , microelectronics , failure rate , computer science , engineering , physics , power (physics) , electrical engineering , quantum mechanics
Empirically based failure rate modelling methodologies employed in reliability prediction handbooks, and deterministic modelling methods are both critically examined using microelectronic packages as vehicles. As an alternative, a coupled mechano‐stochastic approach to reliability prediction modelling is presented. The goal is to use physics of failure principles with appropriate failure probability density distributions to design for failure‐free operation and predict failure times for components now available, as well as new components resulting from new materials, technologies and processes. In addition, an approach for extending the model to aid in logistics support analysis is discussed.