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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, Wayne Nelson. Wiley, New York, 1989. Price: £69.95
Author(s) -
Raheja Dev G.
Publication year - 1990
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680060214
Subject(s) - citation , reliability (semiconductor) , test (biology) , computer science , quality (philosophy) , library science , operations research , information retrieval , engineering , philosophy , epistemology , paleontology , power (physics) , physics , quantum mechanics , biology