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A theoretical approach to a transformer reliability problem
Author(s) -
Pollock J. R.,
Hale P. W.
Publication year - 1990
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680060106
Subject(s) - reliability engineering , transformer , temperature cycling , computer science , reliability (semiconductor) , engineering , voltage , thermal , electrical engineering , power (physics) , physics , quantum mechanics , meteorology
Product reliability testing of a video monitor, incorporating rapid thermal cycling, highlighted an interesting problem with failure of a small transformer on the analogue card, causing a severe shimmer of the display. A theoretical model describing this problem is presented, and shows how such an approach can assist in understanding the failure mechanism as well as assisting the resolution of certain dilemmas surrounding it.