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Fuzzy logic approach to ic quality assurance plan selection
Author(s) -
Kohoutek Henry J.
Publication year - 1989
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680050405
Subject(s) - analogy , selection (genetic algorithm) , quality assurance , fuzzy logic , computer science , quality (philosophy) , comprehension , reliability engineering , plan (archaeology) , process (computing) , artificial intelligence , fuzzy set , microelectronics , data mining , engineering , operations management , programming language , philosophy , linguistics , external quality assessment , archaeology , epistemology , history , electrical engineering
The problem of selection of a proper quality assurance and control programme for manufacturing of microelectronics devices is usually solved empirically by analogy with existing situations, or those experienced in the past. This problem is characterized by incomplete comprehension of influencing variables, unknown relationships among them, and their often vague definitions. This makes it an almost perfect candidate for application of methods from the theory of fuzzy sets and approximate reasoning. One such reasoning process is described here using familiar terms from the MIL‐HDBK‐217E, and is illustrated by an ASIC MOS device example.