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Arrhenius and electronics reliability
Author(s) -
O'connor Patrick D. T.
Publication year - 1989
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680050402
Subject(s) - reliability (semiconductor) , citation , computer science , quality (philosophy) , library science , physics , thermodynamics , power (physics) , quantum mechanics