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Built‐in test for VLSI: Pseudorandom techniques, P. H. Bardell, W. H. Mcanney and J. Savir, Wiley, Chichester, 1987. number of pages: 354. price: £45.00
Author(s) -
O'connor P. D. T.
Publication year - 1989
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680050119
Subject(s) - pseudorandom number generator , citation , test (biology) , computer science , arithmetic , combinatorics , discrete mathematics , mathematics , library science , algorithm , paleontology , biology
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