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Reliability problems in state‐of‐the‐art GaAs devices and circuits
Author(s) -
Christou A.
Publication year - 1989
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680050109
Subject(s) - reliability (semiconductor) , reliability engineering , electronic circuit , state (computer science) , electronic engineering , integrated circuit , computer science , engineering , electrical engineering , physics , algorithm , power (physics) , quantum mechanics
A review of the reliability status of GaAs discrete devices and integrated circuits is given. In the present survey of new devices and circuits it is shown that a significant number of reliability problems continue to persist.