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Reliability theory and applications, proceedings of the China‐Japan reliability symposium, 13–25 september 1987, Shanghai, Xian and Beijing, China. edited by Shunji Osaki and Jinhua Cao. world scientific publishing co., 1987, distributed by John Wiley and sons. number of pages: 445. price: $47.15 (U.K.)
Author(s) -
Lipow Myron,
Wong Kam L.
Publication year - 1988
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680040412
Subject(s) - china , beijing , publishing , citation , reliability (semiconductor) , library science , scientific publishing , operations research , quality (philosophy) , engineering , computer science , political science , philosophy , law , physics , epistemology , power (physics) , quantum mechanics