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Failure mechanisms in semiconductor devices, E. A. Amerasekera and D. S. Campbell. Wiley, Chichester, 1987. Number of pages: 205. Price: $19.95
Author(s) -
Jensen Finn
Publication year - 1988
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680040318
Subject(s) - citation , library science , reliability (semiconductor) , computer science , quality (philosophy) , operations research , mathematics , philosophy , physics , thermodynamics , epistemology , power (physics)
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