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Reliability prediction: A constructive critique of MIL‐HDBK‐217E
Author(s) -
Blanks Henry S.
Publication year - 1988
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680040306
Subject(s) - constructive , reliability (semiconductor) , neglect , independence (probability theory) , reliability engineering , yield (engineering) , categorization , quality (philosophy) , constant (computer programming) , process (computing) , computer science , psychology , engineering , mathematics , statistics , artificial intelligence , philosophy , epistemology , physics , thermodynamics , power (physics) , psychiatry , programming language , operating system
MIL‐HDBK‐217E is based on some major fallacies and oversimplifications. These include the assumption of constant failure rate, the assumed independence of the Pi factors, the oversimplification of temperature dependence, the neglect of process yield and screening fall‐out as determinants in the categorization of quality grade and the absence of manufacturing date information. These weaknesses are discussed and some recommendations made.