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Parameter tolerance design for electrical circuits
Author(s) -
Ilumoka A.,
Spence R.
Publication year - 1988
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680040203
Subject(s) - monte carlo method , maximization , electronic circuit , computer science , minification , probabilistic logic , component (thermodynamics) , circuit design , tolerance analysis , reliability engineering , algorithm , electronic engineering , mathematical optimization , engineering , mathematics , statistics , electrical engineering , engineering drawing , thermodynamics , programming language , physics , artificial intelligence
Realistic circuit design requires that unavoidable tolerances on component parameters be taken into account, particularly in situations where a circuit is to be mass‐produced. Since specifications are normally imposed on circuit performance, parameter tolerances can have the undesirable effect of reducing manufacturing yield (i.e. the percentage of circuits which meet specifications) to values below unity, thereby effectively increasing circuit cost. Approaches have been developed to electrical circuit design which incorporate aspects of parameter tolerance variations at the various stages of design, thus enabling tolerance effects to be assessed and minimized. There are two principal approaches: statistical and deterministic. The first uses probabilistic techniques to predict variations in circuit performance, whereas the second uses deterministic (i.e. non‐stochastic) methods. Within each group, three types of problems are important: first, the maximization of yield, secondly, the minimization of circuit unit cost and, thirdly, the minimization of performance variability. This paper discusses some important advances in the statistical approach to tolerance design. Monte Carlo analysis is almost invariably an important component of the procedure: random fluctuations in parameter values are simulated according to some probability density function and inserted into a computer circuit simulation program which computes corresponding circuit performance variations. The procedure — also referred to as tolerance analysis — not only allows the designer to predict expected performance fluctuations but also presents him with information regarding the relative location of acceptable and non‐acceptable circuits in component parameter space. The Monte Carlo method can handle without difficult any number of component parameters and performance functions; moreover, statistical dependence among parameters is readily handled. The algorithm presented here is experimentally validated through successful design of practical circuits and is applicable to both discrete and integrated circuits. Strategies which ensure computational efficiency of the methods are discussed and a cost/benefit analysis carried out for a typical circuit.