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Accounting for maintenance in a computer memory reliability prediction model
Author(s) -
Miller Jeffrey E.,
Hecht Hebert,
Morris Seymour
Publication year - 1988
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680040114
Subject(s) - mean time between failures , reliability engineering , reliability (semiconductor) , computer science , figure of merit , failure rate , engineering , power (physics) , physics , quantum mechanics , computer vision
This paper reviews the benefit of periodic maintenance for improving the reliability of computer memory protected by error detection and correction (EDAC), and presents a new memory reliability model that accounts for such maintenance. Mean time to failure (MTTF) has been the traditional figure of merit for assessing the benefit of memory maintenance. This paper proposes failure probability calculated at maintenance intervals as a more meaningful figure of merit for periodically maintained systems and presents examples using the new model.