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The reliability growth myth or mess
Author(s) -
Wong Kam L.
Publication year - 1987
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680030403
Subject(s) - reliability (semiconductor) , citation , mythology , quality (philosophy) , management , computer science , engineering , library science , history , philosophy , classics , economics , physics , power (physics) , quantum mechanics , epistemology
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