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Stochastic models in reliability theory: Proceedings of symposium held in Japan, 1984, S. Osaki and Y. Hatoyama (Eds), Springer‐Verlag 1986. No. of pages: 212. Price: DM 37.00
Author(s) -
Vidal Rene. V. V.
Publication year - 1987
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680030116
Subject(s) - citation , reliability (semiconductor) , library science , quality (philosophy) , operations research , mathematical economics , computer science , mathematics , philosophy , physics , thermodynamics , epistemology , power (physics)
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