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The test needs of application‐specific integrated circuits
Author(s) -
Davison Chris
Publication year - 1986
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680020305
Subject(s) - integrated circuit , application specific integrated circuit , reliability engineering , computer science , test (biology) , integration testing , test strategy , software , embedded system , computer architecture , engineering , operating system , paleontology , biology
This paper discusses the particular test needs of non‐standard, application‐specific integrated circuits (ASICs). It covers the need for accurate device simulation integrated with a post‐processor and test system software, to enable cost‐effective testing to be performed.
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