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Vlsi yield management and prediction
Author(s) -
FerrisPrabhu A. V.
Publication year - 1985
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680010403
Subject(s) - very large scale integration , yield (engineering) , limit (mathematics) , sensitivity (control systems) , computer science , characterization (materials science) , reliability engineering , mathematics , engineering , electronic engineering , materials science , nanotechnology , mathematical analysis , metallurgy , embedded system
This paper presents a practical method for managing and predicting the yield of VLSI products, in a manner that will provide insight, with a minimum of mathematical complexity, into the sensitivity of the yield to the different quantities which limit it. The yield equation is cast into a form which makes evident the contributions of its constituent terms and the formulation is developed in a manner that permits its ready application to yield characterization, diagnostics and prediction. An illustrative example is presented that integrates the concepts and methods developed.