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Burn–in models and ttt‐transforms
Author(s) -
Bergman Bo,
Klefsjou Bengt
Publication year - 1985
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680010211
Subject(s) - burn in , reliability (semiconductor) , reliability engineering , computer science , function (biology) , plot (graphics) , reliability theory , econometrics , statistics , failure rate , mathematics , engineering , power (physics) , physics , quantum mechanics , evolutionary biology , biology
The total time on test (TTT) concept has proved to be a very useful tool in many reliability applications. In this paper we illustrate the usefulness of the TTT‐transform, a certain functional of the survival function, and an empirical counterpart called the TTT‐plot when analysing some different burn‐in models for both repairable and non‐repairable units.
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