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Failure Mechanisms in Semiconductor Devices, E. A. AMERASEKERA, (to be published by Gordon & Breach Science Publishers)
Author(s) -
Aagesen Svend M.
Publication year - 1985
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.4680010113
Subject(s) - citation , library science , section (typography) , computer science , reliability (semiconductor) , physics , operating system , power (physics) , quantum mechanics
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