On the distribution of the estimated process yield index  S   pk | Zendy

Lee J. C. | Zendy; Hung H. N. | Zendy; Pearn W. L. | Zendy; Kueng T. L. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

On the distribution of the estimated process yield index S pk

Author(s) -

Lee J. C.,

Hung H. N.,

Pearn W. L.,

Kueng T. L.

Publication year - 2002

Publication title -

quality and reliability engineering international

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.913

H-Index - 62

eISSN - 1099-1638

pISSN - 0748-8017

DOI - 10.1002/qre.450

Subject(s) - mathematics , yield (engineering) , index (typography) , statistics , distribution (mathematics) , asymptotic distribution , interval (graph theory) , combinatorics , computer science , mathematical analysis , physics , estimator , thermodynamics , world wide web

This paper considers an asymptotic distribution for an estimate $\hat{S}_{pk}$ of the process yield index $S_{pk}$ proposed by Boyles (1994). The asymptotic distribution of $\hat{S}_{pk}$ is useful in statistical inferences for $S_{pk}$ . An illustrative example is given for hypothesis testing and for interval estimation on the yield index $S_{pk}$ . Copyright © 2002 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research