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On the distribution of the estimated process yield index S pk
Author(s) -
Lee J. C.,
Hung H. N.,
Pearn W. L.,
Kueng T. L.
Publication year - 2002
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.450
Subject(s) - mathematics , yield (engineering) , index (typography) , statistics , distribution (mathematics) , asymptotic distribution , interval (graph theory) , combinatorics , computer science , mathematical analysis , physics , estimator , thermodynamics , world wide web
This paper considers an asymptotic distribution for an estimate $\hat{S}_{pk}$ of the process yield index $S_{pk}$ proposed by Boyles (1994). The asymptotic distribution of $\hat{S}_{pk}$ is useful in statistical inferences for $S_{pk}$ . An illustrative example is given for hypothesis testing and for interval estimation on the yield index $S_{pk}$ . Copyright © 2002 John Wiley & Sons, Ltd.