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A fraction defective based capability index
Author(s) -
Borges Wagner de Souza,
Ho Linda Lee
Publication year - 2001
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.438
Subject(s) - fraction (chemistry) , estimator , bayesian probability , index (typography) , process capability index , sampling (signal processing) , computer science , process capability , perspective (graphical) , statistics , mathematics , engineering , artificial intelligence , chemistry , chromatography , operations management , work in process , filter (signal processing) , world wide web , computer vision
Two problems greatly affect the use of capability indices such as $C_p$ , $C_{pk}$ and $C_{pkm}$ : the lack of affinity with the process fraction defective π and the difficulty of dealing with the sampling distributions of their natural estimators. In this paper, a capability index which is in one‐to‐one correspondence with π is introduced and simple inferential procedures under a Bayesian perspective are developed to facilitate its use in industrial applications. Copyright © 2001 John Wiley & Sons, Ltd.
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