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Reliability demonstration test for a finite population
Author(s) -
Lu MingWei,
Rudy Richard J.
Publication year - 2001
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.377
Subject(s) - bayesian probability , reliability (semiconductor) , computer science , population , sampling (signal processing) , bayesian statistics , sample (material) , prior probability , sample size determination , statistics , test (biology) , statistical hypothesis testing , bayesian inference , mathematics , artificial intelligence , paleontology , power (physics) , chemistry , physics , demography , filter (signal processing) , chromatography , quantum mechanics , sociology , computer vision , biology
In many situations, we want to accept or reject a population with small or finite population size. In this paper, we will describe Bayesian and non‐Bayesian approaches for the reliability demonstration test based on the samples from a finite population. The Bayesian method is an approach that combines prior experience with newer test data in the application of statistical tools for reliability quantification. When test time and/or sample quantity is limited, the Bayesian approach should be considered. In this paper, a non‐Bayesian reliability demonstration test is considered for both finite and large population cases. The Bayesian approach with ‘uniform’ prior distributions, Polya prior distributions, and sequential sampling is also presented. Copyright © 2001 John Wiley & Sons, Ltd.
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