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An inference method for temperature step‐stress accelerated life testing
Author(s) -
Gouno Evans
Publication year - 2001
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.362
Subject(s) - accelerated life testing , inference , arrhenius equation , stress (linguistics) , maximum likelihood , stress testing (software) , computer science , failure rate , reliability engineering , test data , activation energy , statistics , mathematics , engineering , artificial intelligence , chemistry , linguistics , philosophy , organic chemistry , weibull distribution , programming language
This paper deals with step‐stress accelerated life testing. It presents a practical method to analyse temperature step‐stress accelerated life test data. The Arrhenius model is considered. Activation energy and failure rate under operational conditions are estimated both graphically and using maximum likelihood. Applications on simulated data and on real data are presented. Copyright © 2001 John Wiley & Sons, Ltd.

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