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An additive Chen‐Weibull distribution and its applications in reliability modeling
Author(s) -
Thanh Thach Tien,
Briš Radim
Publication year - 2021
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2740
Subject(s) - weibull distribution , confidence interval , estimator , statistics , reliability (semiconductor) , monte carlo method , bayes' theorem , mathematics , confidence distribution , bathtub , computer science , bayesian probability , power (physics) , physics , archaeology , quantum mechanics , history
In this article, we introduce a new lifetime distribution with increasing and bathtub‐shaped failure rates. Some statistical properties of the proposed distribution are studied. We use the method of maximum likelihood for estimating the model parameters and reliability characteristics and discuss the interval estimates using asymptotic confidence intervals and bootstrap confidence intervals on one hand, and we provide Bayes estimators and highest posterior density intervals for the parameters via Hamiltonian Monte Carlo simulation method on the other hand. We demonstrate the superiority of the proposed distribution by fitting two reliability data sets well‐known from references.