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Generalized inverted exponential distribution under constant stress accelerated life test: Different estimation methods with application
Author(s) -
Dey Sanku,
Nassar Mazen
Publication year - 2020
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2630
Subject(s) - exponential distribution , estimator , mathematics , exponential function , frequentist inference , statistics , constant (computer programming) , reliability (semiconductor) , estimation theory , algorithm , computer science , bayesian probability , bayesian inference , mathematical analysis , power (physics) , physics , quantum mechanics , programming language
Estimation of the parameters of generalized inverted exponential distribution is considered under constant stress accelerated life test. Besides the maximum likelihood method, nine different frequentist methods of estimation are used to estimate the unknown parameters. Moreover, the reliability function is estimated under use conditions based on different methods of estimation. We perform extensive simulation experiments to see the performance of the proposed estimators. As an illustration, a real data set is analyzed to demonstrate how the proposed methods may work in practice.