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Reliability technology using GO methodology: A review
Author(s) -
Yi Xiaojian,
Shi Jian,
Cheng Jun
Publication year - 2019
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2541
Subject(s) - reliability (semiconductor) , computer science , reliability engineering , function (biology) , value (mathematics) , fault tree analysis , risk analysis (engineering) , power (physics) , industrial engineering , engineering , machine learning , physics , quantum mechanics , medicine , evolutionary biology , biology
Goal‐oriented (GO) methodology is a graphic inductive method mapping the system structure, its function constitute, characteristics, and working principle visually based on decision tree. Recently, the studies on reliability technologies for GO method of complex systems have been gotten a lot of attention by scholars because of the obvious advantages of modeling and analysis power. Indeed, the GO method has been applied in reliability and safety analysis of various areas, such as transportation and power systems, to prove its value. Thus, this paper provides a brief review of the GO method from aspects of providing its development history and its engineering applications and expounding its development of the theory of the GO method. At last, the future directions of GO method are discussed.