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A two‐stage degradation model considering the stage‐varying of dispersity regulation
Author(s) -
Wang Zhihua,
Wei Yian,
Wu Qiong,
Liu Chengrui
Publication year - 2019
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2493
Subject(s) - reliability (semiconductor) , inference , degradation (telecommunications) , computer science , key (lock) , process (computing) , stage (stratigraphy) , reliability engineering , population , product (mathematics) , mathematical optimization , statistical inference , engineering , mathematics , statistics , artificial intelligence , power (physics) , telecommunications , paleontology , physics , demography , computer security , geometry , quantum mechanics , sociology , biology , operating system
Abstract In reliability analysis, degradation test has been recognized as an effective method for high reliable products and complex systems when key performance indicators can be observed. Then, a reasonable degradation model becomes a key issue to guarantee a reasonable reliability assessment. Motivated by practical needs, this paper proposes a novel two‐stage degradation model considering the different dispersity regulations corresponding to the two stages. A maximum likelihood estimation (MLE) method for unknown parameters is established, and an initial guess procedure is given to improve the efficiency of optimization algorithm. Then, the reliability inference regarding the product population is discussed. A comprehensive simulation study is conducted to validate the proposed approach where the two‐stage Wiener process model is adopted as a reference for a better understanding. Finally, the constructed model is further verified by two real applications. Comparative results clearly demonstrate the reasonability and effectiveness of the proposed model.