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Reliability analysis using exponentiated Weibull distribution and inverse power law
Author(s) -
MéndezGonzález Luis Carlos,
RodríguezPicón Luis Alberto,
VallesRosales Delia Julieta,
Alvarado Iniesta Alejandro,
Carreón Abel Eduardo Quezada
Publication year - 2019
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2455
Subject(s) - weibull distribution , mean time between failures , reliability (semiconductor) , bathtub , weibull fading , reliability engineering , exponentiated weibull distribution , statistics , power (physics) , capacitor , computer science , mathematics , failure rate , engineering , materials science , electrical engineering , voltage , physics , thermodynamics , decoding methods , rayleigh fading , fading , composite material
Abstract Today in reliability analysis, the most used distribution to describe the behavior of devices is the Weibull distribution. Nonetheless, the Weibull distribution does not provide an excellent fit to lifetime datasets that exhibit bathtub shaped or upside‐down bathtub shaped (unimodal) failure rates, which are often encountered in the performance of products such as electronic devices (ED). In this paper, a reliability model based on the exponentiated Weibull distribution and the inverse power law model is proposed, this new model provides a better approach to model the performance and fit of the lifetimes of electronic devices. A case study based on the lifetime of a surface‐mounted electrolytic capacitor is presented in this paper. Besides, it was found that the estimation of the proposed model differs from the Weibull classical model and that affects the mean time to failure (MTTF) of the capacitor under analysis.