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A global scheme for controlling the mean and standard deviation of a process based on the optimal design of gauges
Author(s) -
Mosquera Jaime,
Aparisi Francisco,
Epprecht Eugenio Kahn
Publication year - 2018
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2282
Subject(s) - scheme (mathematics) , process (computing) , variable (mathematics) , statistical process control , standard deviation , base (topology) , mathematical optimization , computer science , control chart , control (management) , gauge (firearms) , control variable , mathematics , statistics , artificial intelligence , machine learning , mathematical analysis , archaeology , history , operating system
Control charts for variables are a reference tool for the statistical monitoring of a quantitative variable. However, there are processes in which the exact measurement of the variable is highly complex or costly. In these cases, one option is to base the monitoring on the number of units that are classified by a gauge as being above, below, or between a pair of reference limits. With this approach, the process control achieves the economy and agility of control by attributes. In the literature, one can find different alternatives to such schemes. In this paper, a more general formulation is introduced that subsumes many of the previously proposed schemes into a new control scheme by means of an additional parameter. Through a specially designed optimization procedure, it is possible to obtain the parameters that maximize the scheme's performance against a specified process shift.