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Reliability Analysis and Condition‐based Maintenance for Failure Processes with Degradation‐dependent Hard Failure Threshold
Author(s) -
Rafiee Koosha,
Feng Qianmei,
Coit David W.
Publication year - 2017
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.2109
Subject(s) - degradation (telecommunications) , reliability (semiconductor) , reliability engineering , limit (mathematics) , stress (linguistics) , threshold limit value , computer science , engineering , mathematics , power (physics) , physics , chemistry , thermodynamics , telecommunications , mathematical analysis , linguistics , philosophy , organic chemistry
In this study, we introduce reliability models for a device with two dependent failure processes: soft failure due to degradation and hard failure due to random shocks, by considering the declining hard failure threshold according to changes in degradation. Owing to the nature of degradation for complex devices such as microelectromechanical systems, a degraded system is more vulnerable to force and stress during operation. We address two different scenarios of the changing hard failure threshold due to changes in degradation. In Case 1, the initial hard failure threshold value reduces to a lower level as soon as the overall degradation reaches a critical value. In Case 2, the hard failure threshold decreases gradually and the amount of reduction is proportional to the change in degradation. A condition‐based maintenance model derived from a failure limit policy is presented to ensure that a device is functioning under a certain level of degradation. Finally, numerical examples are illustrated to explain the developed reliability and maintenance models, along with sensitivity analysis. Copyright © 2016 John Wiley & Sons, Ltd.