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Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors
Author(s) -
Wang FuKwun
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1946
Subject(s) - gauge (firearms) , yield (engineering) , nonlinear system , process (computing) , process capability , process capability index , reliability engineering , estimator , index (typography) , observational error , computer science , engineering , mathematics , statistics , work in process , materials science , operations management , physics , quantum mechanics , world wide web , metallurgy , operating system
Process yield plays an important role in many manufacturing industries for measuring process performance. However, gauge measurement errors have significant effect on process capability analysis. In this study, we present a method based on the yield index to evaluate the process yield of nonlinear profiles in the presence of gauge measurement errors. The results indicate that the presence of gauge measurement errors in the data leads to different behaviors of the yield index estimator according to the existence of the gauge variability. Our proposed test procedure can be easily used to determine whether or not manufacturing processes meet the quality requirements when gauge measurement errors are considered. A real example from a manufacturing process is used to demonstrate the applications of the proposed method. Copyright © 2015 John Wiley & Sons, Ltd.